view article
Figure 3
One-shot X-ray topographs: (a) the sliced wafer (sample 1) and (b) the lapped wafer (sample 2). (a) and (b) were recorded using the peak position of the rocking curve measured at the central position of each wafer. The arrow shows the diffraction vector g for all the topographs.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 9| Part 3| April 2002| Pages 166-168
doi:10.1107/S0909049502003448
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS