issue contents

Journal logoJOURNAL OF
ISSN: 1600-5775

September 2002 issue

Highlighted illustration

Cover illustration: The reflected amplitude on the [sigma][pi] plane of circularly polarized incident radiation in the study of the time dependence of the polarization of short X-ray pulses after crystal reflection, see Graeff, pages 293-297.

facility information

research papers

J. Synchrotron Rad. (2002). 9, 277-281
doi: 10.1107/S090904950201350X
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The development and successful operation of a large-area (25 × 20 mm) phase-contrast X-ray imaging system using a two-crystal X-ray interferometer is reported.

J. Synchrotron Rad. (2002). 9, 282-286
doi: 10.1107/S0909049502010294
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A versatile bendable monochromator double-crystal diffractometer was constructed, to investigate, using synchrotron radiation, single-crystal samples with high strain sensitivity and without any reduced image sizes. It is based on a local adaptation of Bragg angles between monochromator and sample.

J. Synchrotron Rad. (2002). 9, 287-292
doi: 10.1107/S0909049502011226
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The natural bandwidth of a single-line undulator is used to measure solution scattering and optimize flux requirements for laser-pump–X-ray-probe time-resolved excitation studies.

J. Synchrotron Rad. (2002). 9, 293-297
doi: 10.1107/S0909049502010117
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The time dependence of the polarization of short X-ray pulses is simulated by Fourier transforms using the steady-state solutions from dynamical theory. The mixed states in particular show a very pronounced time dependence, as perpendicular and parallel polarization components have a different time response.

J. Synchrotron Rad. (2002). 9, 298-303
doi: 10.1107/S0909049502010567
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Atomic applications for XFELs are presented that include strong field effects, multiple ionization and hollow-atom formation.

J. Synchrotron Rad. (2002). 9, 304-308
doi: 10.1107/S0909049502012955
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First time-resolved X-ray absorption spectroscopy experiments to study oxidation state and structural changes of biological metal centers are reported. The future impact of time-resolved BioXAS is discussed.

J. Synchrotron Rad. (2002). 9, 309-312
doi: 10.1107/S0909049502011949
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An X-ray diffractometer has been designed for industrial applications and installed at SPring-8 BL24XU in Japan. The diffractometer has been used for the grazing-incidence X-ray diffraction measurement of ion-implanted chromium-coated samples and for the X-ray stress measurement of polished stainless steel using our proposed new method.

J. Synchrotron Rad. (2002). 9, 313-316
doi: 10.1107/S0909049502012578

J. Synchrotron Rad. (2002). 9, 317-322
doi: 10.1107/S0909049502009986
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A cryogenically cooled silicon monochromator for high-energy undulator X-rays (50–200 keV) using two bent Laue crystals is presented.

short communications

J. Synchrotron Rad. (2002). 9, 323-324
doi: 10.1107/S0909049502011597
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A description of the commissioning of a new high-pressure flow cell, used to monitor in situ precipitation of barium sulphate under non-ambient conditions.
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