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Figure 3
Sketch of the incident-beam detector. The beam is sized by a thin (50–100 µm) slit and hits a fluorescent metallic foil. The component of the foil is chosen depending on the energy region. The X-ray fluorescence induced by the beam is collected by a large-area Si PIN photodiode positioned near the foil. At the end a wider slit (100–200 µm) is used to clean the probe beam from slit scattering and residual fluorescence. The block is mounted on a vertical translator for accurate positioning of the slit on the beam.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 10| Part 3| April 2003| Pages 260-264
doi:10.1107/S0909049503005582
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