An X-ray diffractometer for accurate structural invariant phase determination

Morelhão, S.L.

doi:10.1107/S0909049503003789

Figure 5
Two-dimensional intensity profiles (ω:ϕ maps) of a three-beam diffraction for (a) σ and (b) π polarizations. Primary wave E_P from reflection 006 (reflection A). Secondary wave E_S from reflections 113 and $[\bar1\bar13]$ (B and C reflections). Crystal: GaSb (001). Wavelength: 1.4370 Å. Beam divergences: 9" (vertical) and 23.8" (horizontal). Mesh resolution: (a) 0.0032° and (b) 0.0016°.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 10| Part 3| April 2003| Pages 236-241

doi:10.1107/S0909049503003789

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