A focusing crystal analyser for the rejection of inelastic X-ray scattering

Hamilton, M.A.; Metzger, T.H.; Mazuelas, A.; Buslaps, T.

doi:10.1107/S0909049503000402

Figure 9
Results collected with the bent Si(422) crystal at the Cs K-edge showing RRS (K–M, K–N) and Compton scattering. The Gaussian curves are a schematic representation of the RRS (dots) and Compton (dash) contributions.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 10| Part 3| April 2003| Pages 255-259

doi:10.1107/S0909049503000402

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