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Figure 2
DEI of a tree leaf at different angular positions of the analyzer crystal. (a) Near to the analyzer peak position. (b) and (c) At different angular positions further away from the peak positions (see Fig. 3[link]). Contrast inversion (dark to bright) at some features of the leaf stem (indicated by the arrow), only possible with phase-contrast techniques, is demonstrated. Exposure times: (a) 2 min; (b) and (c) 6 min.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 10| Part 6| October 2003| Pages 421-423
doi:10.1107/S0909049503020144
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