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Figure 10
Comparison of XAFS spectra of Zr foil as in Fig. 9[link] but with an added aluminium attenuator (1.22 mm) on the surface of the sample. The Si(333) reflection of the monochromator and third harmonic of the undulator were used (a) without and (b) with the beam cleaner. Note that the spectrum in (b) is identical to that of Fig. 9(b)[link] apart from a vertical shift due to aluminium absorption. Experimental configurations for these spectra are shown in Figs. 7(c) and 7(e)[link].

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 11| Part 5| August 2004| Pages 393-398
doi:10.1107/S0909049504016711
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