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Figure 6
Adsorption isotherm of the system CO2 on silicon. The film thickness is displayed as a function of normalized pressure p/p0 where p0 is the condensation pressure at T = 273 K. The solid line is a refinement of equation (2)[link] leading to an effective Hamaker constant of Aeff = (−7.9 ± 1) × 10−19 J.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 15| Part 6| October 2008| Pages 600-605
doi:10.1107/S0909049508026745
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