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Figure 8
In situ measured specular reflectivity profiles (13.35 keV photon energy) of a thin Bi film (18 nm thickness) on a glass substrate, deposited and measured at 15 K, and after annealing at 300 K. Reflection-mode EXAFS spectra at the Bi L3-edge (13.419 keV) were measured for φ = 0.242° (dashed vertical line) and are depicted in the inset. The strong reduction of the overall reflectivity as well as the smaller EXAFS oscillations are obvious after warming up the films to 300 K.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 16| Part 2| March 2009| Pages 264-272
https://doi.org/10.1107/S0909049509000508
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