A curved image-plate detector system for high-resolution synchrotron X-ray diffraction

Sarin, P.; Haggerty, R.P.; Yoon, W.; Knapp, M.; Berghaeuser, A.; Zschack, P.; Karapetrova, E.; Yang, N.; Kriven, W.M.

doi:10.1107/S0909049509001265

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 6
The CIP detector can be operated over a wide range of incident energy with comparable resolution. Data from an analyzer are presented for comparison.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 16| Part 2| March 2009| Pages 273-282

https://doi.org/10.1107/S0909049509001265

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