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Figure 5
(a) Alignment of the focal point of the xenon lamp to the focal plane of the alignment camera using a camera mounted directly above the beamline and a pin at the sample position; the focus of the Schwarzschild objective can be clearly seen. The placement of a scintillator at the sample position allows the sample alignment camera to be used for alignment of the X-ray and optical axes: (b) X-ray shutter closed, optical shutter open; (c) both X-ray and optical shutters open with objective mis-aligned; (d) both X-ray and optical shutter open with the position of the yaw of the objective mount adjusted to maximize overlap of the X-ray and optical beams at the sample position.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 16| Part 2| March 2009| Pages 173-182
https://doi.org/10.1107/S0909049508040120
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