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Figure 4
Normalized sensitivity of diode PIN-10DPI as a function of tilt angle at different incident X-ray energies. Line plots of equation (5) (tSi 401.9 ± 0.5 µm, tw 0.33 ± 0.01 µm) are overlaid on the experimental points for each energy. |
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Figure 4
Normalized sensitivity of diode PIN-10DPI as a function of tilt angle at different incident X-ray energies. Line plots of equation (5) (tSi 401.9 ± 0.5 µm, tw 0.33 ± 0.01 µm) are overlaid on the experimental points for each energy. |