High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies

Strocov, V.N.; Schmitt, T.; Flechsig, U.; Schmidt, T.; Imhof, A.; Chen, Q.; Raabe, J.; Betemps, R.; Zimoch, D.; Krempasky, J.; Wang, X.; Grioni, M.; Piazzalunga, A.; Patthey, L.

doi:10.1107/S0909049510019862

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 11
Image-processing software for evaluating the beam profile at the exit slit. Left: image with the region of interest containing the vertical line of energy-dispersed light. Right: horizontal beam profile and its Gaussian fit yielding the horizontal beam position and width.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 17| Part 5| July 2010| Pages 631-643

doi:10.1107/S0909049510019862

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