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Figure 4
(a) Photograph of the sample chamber of the HDAC containing a zircon crystal (ZrSiO4) and an aqueous solution at 1023 K. (b) Vertical scan of Zr Kα intensity normalized to the incident beam intensity across the sample chamber shown in (a). Error bars indicate the standard deviation of the measured signal. Measurement was performed at beamline L. (c) Photograph of the sample chamber of the HDAC containing a zircon crystal (ZrSiO4) and an aqueous solution at 873 K. (d) Vertical scan of Zr Kα intensity normalized to the incident beam intensity across the sample chamber shown in (c). Error bars indicate the standard deviation of the measured signal. The measurement was performed at beamline L. (e) Vertical scans of the Hf Lα intensity normalized to the incident beam intensity across the sample chamber containing a hafnon crystal (HfSiO4) at various positions to the recess. See text for details. Scans show two points in time. Error bars indicate the standard deviation of the measured signal. Measurements were performed at ID24.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 17| Part 5| July 2010| Pages 669-675
doi:10.1107/S0909049510023654
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