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Figure 9
Normalized peak intensities from positive (top) and negative (bottom) ion ToF-SIMS of freshly polished and oxidized chalcopyrite. The inset in the negative-ion graph is an expansion of the sulfur species peak intensities. Light grey, freshly polished; dark grey, oxidized in pH 9 solution. Error bars represent the statistically significant confidence intervals (P = 95%) for each mass signal.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 17| Part 5| July 2010| Pages 606-615
doi:10.1107/S0909049510026749
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