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Figure 11
Intensity in the detector downstream of the sample acquired during the alignment of a copper thin-film sample for a ReflEXAFS measurement varying the incident angle (`rocking scan') (top) and the vertical position in the beam (bottom).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 18| Part 2| March 2011| Pages 165-175
https://doi.org/10.1107/S0909049510051897
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