Journal of Synchrotron Radiation
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Figure 3
Relative change of the integrated areas of the
ν
as
(Si—O—Si) band (left axis) and Si—OH band (right axis) as a function of the exposure dose in silica sol–gel films. The lines are a visual guide only.
JOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 18
|
Part 2
|
March 2011
|
Pages 280-286
https://doi.org/10.1107/S0909049510051666
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The IUCr is a scientific union serving the interests of crystallographers and other scientists employing crystallographic methods.