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![[Figure 1]](hf5193fig1mag.jpg)
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Figure 1
Conceptual figures of the sample and experimental set-up. (a) The sample studied was formed from a PAA solution applied to and aged on a thin film of PVP-capped Ag-Nps initially deposited on a Si-wafer support (actual AFM image of Ag-Nps shown). The Ag-Nps (blue spheres) shown suspended in the PAA represent a small fraction of Ag-Nps that detached from the substrate during aging. (b) Experimental set-up for the fluorescence yield and diffraction-based measurements as well as specular reflectivity using 14 keV synchrotron X-rays. The reflectivity was measured as a function of αi and 2αi (°) using an ion chamber (I1); the grazing-incidence XRD and XRD-based X-ray standing-wave profiles (XSW-XRD) were measured as a function of 2θ (°) and αf (°), respectively, using a two-dimensional array detector (I2). Fluorescence yield was measured orthogonal to the sample using a high-resolution fluorescence detector (I3). |
![[Figure 1]](hf5193fig1.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
