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Figure 2
Specular reflectivity fitting and AFM results. The measured reflectivity profile (open symbols) was fitted using a multi-layer model composed of Si-wafer, Ag and PAA (black solid line). The approximate critical angles of both the PAA and the PVP-capped Ag-Nps thin films are shown as θcrit-PAA and θcrit-Ag-Nps, respectively. The table includes the thickness and interface roughness values from reflectivity fitting and AFM measurements.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 18| Part 6| October 2011| Pages 871-878
doi:10.1107/S090904951103843X
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