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Figure 5
GI-XRD and XRD-based XSW for AgCl and Ag0. (a) GI-XRD profiles collected at the seven incidence (αi) angles shown in (b). Diffraction maxima from crystalline phases can be indexed with the known structures of AgCl and metallic Ag. Diffuse scattering from an unreacted PAA is shown for comparison (solid grey). (b, c) XRD-based X-ray standing waves from diffraction features corresponding to Ag-Nps (Ag0) or AgCl. The Ag0 and AgCl profiles were obtained from tracking the intensities of the (111) and (002) reflections, respectively, as a function of incidence angle (αi). The individual XRD-based standing-wave profiles were each fitted with the same two-box model used for the XSW-FY data shown in Fig. 4[link].

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 18| Part 6| October 2011| Pages 871-878
doi:10.1107/S090904951103843X
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