Capabilities of through-the-substrate micro­diffraction: application of Patterson-function direct methods to synchrotron data from polished thin sections

Rius, J.; Labrador, A.; Crespi, A.; Frontera, C.; Vallcorba, O.; Melgarejo, J.C.

doi:10.1107/S0909049511038830

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 1
General view of the sample holder, motorized XYZ-stage with goniometric head, 12× video microscope and one-dimensional masking beam-stop (here positioned upwards out of the beam). To collect the two-dimensional XRD pattern, the sample is rotated by 90° around φ after positioning.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 18| Part 6| October 2011| Pages 891-898

doi:10.1107/S0909049511038830

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