Capabilities of through-the-substrate micro­diffraction: application of Patterson-function direct methods to synchrotron data from polished thin sections

Rius, J.; Labrador, A.; Crespi, A.; Frontera, C.; Vallcorba, O.; Melgarejo, J.C.

doi:10.1107/S0909049511038830

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Figure 4
(a) Powder diffraction patterns T and G corresponding to AE150 (solid line) and to G150 (dashed line), respectively. T has contributions from thin section plus glass substrate, while G only from glass substrate. The AE150 pattern has been shifted up in the main panel. The inset shows ky_G (k = 0.94) and y_T around the maximum of y_G. (b) Plot of the difference powder pattern S (y_S = y_T − 0.94y_G) for AE150. The inset shows a zoom of the high-angle region.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 18| Part 6| October 2011| Pages 891-898

doi:10.1107/S0909049511038830

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