Capabilities of through-the-substrate micro­diffraction: application of Patterson-function direct methods to synchrotron data from polished thin sections

Rius, J.; Labrador, A.; Crespi, A.; Frontera, C.; Vallcorba, O.; Melgarejo, J.C.

doi:10.1107/S0909049511038830

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 5
Full-pattern matching for the AE150 pattern of aerinite. Observed values are represented as circles. Solid lines correspond to the calculated pattern and the difference profile (bottom). Bragg reflections are represented as small vertical lines.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 18| Part 6| October 2011| Pages 891-898

doi:10.1107/S0909049511038830

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