Capabilities of through-the-substrate micro­diffraction: application of Patterson-function direct methods to synchrotron data from polished thin sections

Rius, J.; Labrador, A.; Crespi, A.; Frontera, C.; Vallcorba, O.; Melgarejo, J.C.

doi:10.1107/S0909049511038830

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Figure 6
Application of Patterson-function direct methods to powder data of aerinite derived from tts-µXRD patterns measured at BM16. Crystal data of aerinite: a = 16.9, c = 5.2 Å; approximate unit-cell content: Ca₅Fe₃Al₆[Si₁₂O₃₆(OH)₁₂]·12H₂O, P3c1. Inspection of the image, automatically generated from the Fourier map of the highest-ranked direct-methods solution, indicates that the model is essentially equivalent to that found by Rius et al. (2004

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 18| Part 6| October 2011| Pages 891-898

doi:10.1107/S0909049511038830

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