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Figure 6
(a) Intensities of the SiO2 suspension at different sample-to-detector distances. Symbols are the data. Thick solid lines are the fittings based on equation (23)[link]. Thin solid lines are obtained by fitting the local minima with a stretched exponent, describing the contribution of multiple scattering. Data are displaced by a factor of ten for clarity. (b) The best-fit exponent [\beta] versus sample-to-detector distances varying from 53 mm to 203 mm for the silica 0.45 µm suspension.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 18| Part 6| October 2011| Pages 823-834
doi:10.1107/S0909049511037149
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