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Figure 4
(a) A 120 µm × 100 µm × 80 µm Si crystal for the ARPES measurement. (b) Schematic view of the double-sided tape and aluminium tube, which were used for the Laue measurement. (c) Laue camera system, where the aluminium tube was put at the exit of the X-ray source. The sample attached on the tape was located in the path of the X-ray beam. (d) Schematic drawing of the system for mounting the sample onto the electroconductive glue applied on the pole of cross section 1 mm × 1 mm. The sample position relative to the glue is horizontally monitored by two cameras (one is not shown in the figure) and adjusted by the XYZ stage. (e) One of the camera monitors, which showed the sample, the lower half of which was embedded in the electroconductive glue. (f) Sample carrier on which the base plate was screwed.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 18| Part 6| September 2011| Pages 879-884
doi:10.1107/S0909049511034418
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