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Figure 5
(a) Si crystal mounted on the electroconductive glue observed by an optical microscope before it was installed in the vacuum. The crystal orientation is also indicated. (b) Si crystal in the cleaving chamber, observed through a viewport after cleaving.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 18| Part 6| September 2011| Pages 879-884
doi:10.1107/S0909049511034418
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