Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-II

Honnicke, M.G.; Keister, J.W.; Conley, R.; Kaznatcheev, K.; Takacs, P.Z.; Coburn, D.S.; Reffi, L.; Cai, Y.Q.

doi:10.1107/S0909049511031098

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Figure 1
(a) Schematic representation of the L-shaped laterally graded multilayer mirror used as a two-dimensional focusing device for an incoming parallel beam (parabolic figure). (b) Mirror figure (parabolic) with a parabola parameter, p = 0.308 mm. (c) Theoretical reflectivity for a flat Si substrate coated with 100 W/C graded bi-layers (2.5 nm each, W 1.0 nm-thick and C 1.5 nm-thick) at 9.1 keV. (d) Lattice parameter, d, versus distance along the mirror surface for the parabolic laterally graded multilayer mirror.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 18| Part 6| September 2011| Pages 862-870

doi:10.1107/S0909049511031098

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