Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-II

Honnicke, M.G.; Keister, J.W.; Conley, R.; Kaznatcheev, K.; Takacs, P.Z.; Coburn, D.S.; Reffi, L.; Cai, Y.Q.

doi:10.1107/S0909049511031098

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 4
Schematic representation of the reflectivity measurements. A, B and C indicate the positions on both surfaces of the L-shaped laterally graded multilayer mirror where reflectivity measurements were taken. The inset shows the reflectivity curve taken in the position B (center) of surface 1 of the mirror.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 18| Part 6| September 2011| Pages 862-870

doi:10.1107/S0909049511031098

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