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Figure 7
(a) Photograph of the experiment set-up for the reflectivity measurement taken in the hutch of R&D NSLS-II beamline at NSLS (X16A). (i) Ionization chamber, (ii) L-shaped mirror, (iii) x/y slits, (iv) PIN diode detector. (b) Reflectivity curve taken from both surfaces simultaneously. The inset shows details of the reflectivity curve showing convoluted Pendellösung effects from both surfaces.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 18| Part 6| September 2011| Pages 862-870
doi:10.1107/S0909049511031098
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