Figure 4
Photograph of the microtomography station in EH1. The sketch shows the classical layout of a high-resolution indirect X-ray detector compromising a scintillator screen, visible-light optics and a digital camera (Weitkamp et al., 1999). For alignment purposes the FReLoN 2k camera is mounted on a rotation stage (not shown in the sketch), and the sample-to-detector distance can be changed between approximately 6 and 800 mm. |