Assessing noise sources at synchrotron infrared ports

Lerch, P.; Dumas, P.; Schilcher, T.; Nadji, A.; Luedeke, A.; Hubert, N.; Cassinari, L.; Boege, M.; Denard, J.-C.; Stingelin, L.; Nadolski, L.; Garvey, T.; Albert, S.; Gough, Ch.; Quack, M.; Wambach, J.; Dehler, M.; Filhol, J.-M.

doi:10.1107/S0909049511041884

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 1
Top panel: entire spectrum of benzole measured at the SLS in a long-path cell. Absorption actually occurs between 600 and 900 cm⁻¹. The three following panels show low-frequency noise outside the region of interest measured at different resolutions. The residual low-frequency noise is important at the highest resolution. Scanner rate: 40 kHz.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 19| Part 1| January 2012| Pages 1-9

https://doi.org/10.1107/S0909049511041884

Open

access

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page