Assessing noise sources at synchrotron infrared ports

Lerch, P.; Dumas, P.; Schilcher, T.; Nadji, A.; Luedeke, A.; Hubert, N.; Cassinari, L.; Boege, M.; Denard, J.-C.; Stingelin, L.; Nadolski, L.; Garvey, T.; Albert, S.; Gough, Ch.; Quack, M.; Wambach, J.; Dehler, M.; Filhol, J.-M.

doi:10.1107/S0909049511041884

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 4
Top: vertical light intensity profile at two photon energies. The size of the slot in M1 is depicted. Bottom: measured and calculated relative flux change reflected by a 2 mm slotted M1 mirror.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 19| Part 1| January 2012| Pages 1-9

https://doi.org/10.1107/S0909049511041884

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