Assessing noise sources at synchrotron infrared ports

Lerch, P.; Dumas, P.; Schilcher, T.; Nadji, A.; Luedeke, A.; Hubert, N.; Cassinari, L.; Boege, M.; Denard, J.-C.; Stingelin, L.; Nadolski, L.; Garvey, T.; Albert, S.; Gough, Ch.; Quack, M.; Wambach, J.; Dehler, M.; Filhol, J.-M.

doi:10.1107/S0909049511041884

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Figure 9
Ratio of two consecutive IR spectra (average of 100 spectra, resolution 4 cm⁻¹) measured through a 10 µm-diameter pinhole placed in the focus of an IR microscope equipped with a pair of X15 Schwarzchild optics. (A) RF sub-system causing excess noise turned on. (B) RF sub-system turned off.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 19| Part 1| January 2012| Pages 1-9

https://doi.org/10.1107/S0909049511041884

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