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Figure 2
(a) Geometries of beams and a Si strip fixed at one end. (b) Schematic diagram of the measuring system. Synchrotron radiation X-rays are monochromated by a Si 111 double crystal. Diffraction intensities ([P_{{h}}^{\langle1\rangle}] and [{P_{{h}}^{\,\prime}}]) are measured either by scintillation counter (SC) or nuclear plate. (c) Schematic diagram of the beam geometry around the MBL interferometer.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 19| Part 1| January 2012| Pages 101-105
https://doi.org/10.1107/S0909049511047078
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