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Figure 2
(Colour online) Schematics of the full-field imaging experiment (the case of the bend sample, 0.3 mm-thick substrate). The parallel incident X-ray beam is focused by the sample, both in the longitudinal and sagittal directions. The result is a distorted image on the area detector. Images at several distances are taken: (1) close to focal point; (2) out of the focal point and (3) far away from the focal point. The structure of the sample is similar to the one shown in Fig. 1(b)[link].

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 20| Part 2| January 2013| Pages 355-365
doi:10.1107/S090904951204856X
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