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Figure 1
Schematic view of the beamline with the diffraction focusing spectrometer. The incoming beam from the source is focused by the compound refractive lenses (CRLs) and creates the secondary source. The flat crystal is positioned in a Laue geometry behind this secondary source. The high-resolution detector is located close to the crystal in the direction of the diffracted beam.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 20| Part 2| January 2013| Pages 258-265
doi:10.1107/S0909049513000903
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