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Figure 2
Main components of the diffraction focusing spectrometer. The secondary source plane is described by the coordinate xs, the crystal is positioned at a distance L0 from the source, and the detector is located at a distance L1 from the crystal in the direction of the Laue diffracted beam defined by the vector [{\bf k}_h]. The detector plane is described by the coordinate xd.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 20| Part 2| January 2013| Pages 258-265
doi:10.1107/S0909049513000903
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