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Figure 3
The case of a silicon 220 reflection. (a) Two-dimensional distribution of the intensity. (b) Intensity in the central position of the image xd = 0 as a function of crystal thickness t.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 20| Part 2| January 2013| Pages 258-265
doi:10.1107/S0909049513000903
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