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Figure 5
Comparison of the intensity profiles at the detector position. (a) Silicon 220 reflection, crystal thickness t0 = 360 µm. Direct calculations using equation (1)[link] (red line) and analytical results based on equations (8)[link] (blue line) and (15)[link] (green line) are presented. (b) Diamond 220 reflection, crystal thickness t0 = 158 µm. Direct calculation using equation (1)[link] (red line) and analytical results based on equations (8)[link] and (15)[link] (blue line) are presented. Both intensity profiles obtained from the analytical result completely coincide with each other in this case.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 20| Part 2| January 2013| Pages 258-265
doi:10.1107/S0909049513000903
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