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Figure 7
(a) Simulated XFEL spectrum with an incoming photon energy of 12.4 keV, pulse duration T = 100 fs and spectral width [\Delta\omega/\omega] = 10-3. (b) Corresponding intensity distribution at the detector after 220 diffraction of this pulse from a Si crystal. Insets show an enlarged part of the spectrum.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 20| Part 2| January 2013| Pages 258-265
doi:10.1107/S0909049513000903
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