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![[Figure 2]](ve5014fig2mag.jpg)
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Figure 2
ML-BSs having (a) compressive stress in the ML as measured on Si stress wafers (Γ = 0.4), (b) zero-stress ML, and (c) ∼100 MPa tensile stress in the ML. |
![[Figure 2]](ve5014fig2.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
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Figure 2
ML-BSs having (a) compressive stress in the ML as measured on Si stress wafers (Γ = 0.4), (b) zero-stress ML, and (c) ∼100 MPa tensile stress in the ML. |
| JOURNAL OF SYNCHROTRON RADIATION |
