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Figure 4
Measured reflectivity curves for ML coatings with d = 7 nm, N = 12 and Γ = 0.5 on a superpolished Si wafer (blue curve) and on a 50 nm SiN membrane (red curve) with a higher surface roughness.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 20| Part 2| January 2013| Pages 249-257
doi:10.1107/S0909049512049990
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