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Figure 1
(a) Scattering intensities as a function of the sample thickness in transmission (Laue) and reflection (Bragg) geometry. (b) Reflectivity curves of bent (B) and flat (or diced) (F) analyzers at 21.78 keV.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 20| Part 2| January 2013| Pages 266-271
doi:10.1107/S0909049512048789
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