An X-ray Raman spectrometer for EXAFS studies on minerals: bent Laue spectrometer with 20 keV X-rays

Hiraoka, N.; Fukui, H.; Tanida, H.; Toyokawa, H.; Cai, Y.Q.; Tsuei, K.D.

doi:10.1107/S0909049512048789

Journal of Synchrotron Radiation Journal of
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Figure 2
(a) Layout of beamline BL12XU/SP8. DCM, double-crystal monochromator; CM, collimating mirror; HRM, channel-cut high-resolution monochromator; FM, focusing mirror; KB, Kirkpatrick–Baez mirror. Mirrors are all Pt-coated. PN indicates a Si PIN diode for beam monitoring. (b) Sketch of the bent Laue spectrometer.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 20| Part 2| January 2013| Pages 266-271

doi:10.1107/S0909049512048789

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