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Figure 5
(a) X-ray reflectivity profiles corresponding to the dry silicon substrate (circles) and to the toluene film adsorbed at [\Delta T]: 11.452 K (right triangles, ×10-2), 3.150 K (squares, ×10-4), 963 mK (left triangles, ×10-6), 551 mK (up-triangles, ×10-8), 142 mK (down-triangles, ×10-10) and 60 mK (diamonds, ×10-12). The solid lines are two-box model fits yielding the electron density profiles presented in (b). (c) Fitted thickness of the wetting film as a function of [\Delta T] in log–log representation. The power-law fit (red line) to the data is consistent with the expected d [\propto] [\Delta T^{-1/3}] dependence.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 20| Part 2| February 2013| Pages 306-315
doi:10.1107/S0909049513001143
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