Development of a single-shot CCD-based data acquisition system for time-resolved X-ray photoelectron spectroscopy at an X-ray free-electron laser facility

Oura, M.; Wagai, T.; Chainani, A.; Miyawaki, J.; Sato, H.; Matsunami, M.; Eguchi, R.; Kiss, T.; Yamaguchi, T.; Nakatani, Y.; Togashi, T.; Katayama, T.; Ogawa, K.; Yabashi, M.; Tanaka, Y.; Kohmura, Y.; Tamasaku, K.; Shin, S.; Ishikawa, T.

doi:10.1107/S1600577513028233

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Figure 7
Au 4f photoelectrons intensity maps (a) before and (b) after correction, measured in shot-to-shot image mode as a function of shot number.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 21| Part 1| December 2014| Pages 183-192

doi:10.1107/S1600577513028233

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