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Figure 6
(a) X-ray intensities and (b) XAFS spectra at the V K-edge (5.439 keV) in planar, tapered and gap-scan modes with a gap of 5.1 mm. Inset: XAFS spectra around the absorption-edge region. Spectra are shifted along the y axis for a clearer view. Coordinates of beam intensity profiles are the same as in Fig. 5[link].

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 6| October 2014| Pages 1282-1287
doi:10.1107/S1600577514015549
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