journal menu
![[Figure 1]](hf5269fig1mag.jpg)
|
|
Figure 1
Measurement geometry for calculation of how the measured XRF intensity varies with surface orientation. The xy plane is defined by the incident X-ray beam direction and detector. Left: b, d, n are the incident beam direction, the direction from the interaction point to the detector, and the surface normal direction (which in general projects out of the xy plane), respectively. The rotations of n and d around the z axis (with respect to −b) are given by θ and α, respectively. Right: expanded view of the region around the interaction point. The incident beam travels a distance si from the surface to the interaction point, and the fluorescent photons travel a distance sf from the interaction point to the surface. |
![[Figure 1]](hf5269fig1.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
