view article
Figure 5
(a) Eu L2-edge Fourier-transformed extended X-ray absorption fine structure (FT-EXAFS) spectrum of EuSi2 film with Eu coverage of 100 nm (black) and best fits to data (red). The interatomic distance R (Å) is not phase-shift corrected in the figure. Vertically shifted are the contributions of the single scattering paths used in the modeling. EXAFS spectra and best fits (b) k3-weighted and (c) q3-weighted.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 1| January 2015| Pages 91-98
https://doi.org/10.1107/S1600577514019705
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS